The Sixth International Symposium on

Measurement Technology and Intelligent Instruments

28 November - 1 December 2003
Academic Building, Hong Kong University of Science and Technology, Kowloon, Hong Kong

Keynote Addresses

Novel Optical Techniques for Nanometer Measurements
Takashi Miyoshi, Osaka University, Japan
Abstract and Brief Biography

The NIST Standard Bullets and Casings Project
Jun-Feng Song, National Institute of Standards and Technology, USA
Abstract and Brief Biography

Advances in Micro and Nano-Scale Surface Metrology
Liam Blunt, University of Huddersfield, UK
Abstract and Brief Biography

On-Line Industrial 3D Measurement Techniques for Large Volume Objects
Shenghua Ye, Tianjin University, China
Abstract and Brief Biography

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09 March 2010